BSIM and Open Innovation
Coming soon
Keynote Speaker
Transient Measurements are the Real Challenge Facing ESD Compact Modelers
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Physical Insights Beyond the Textbook Modeling of MOSFETs and p-n Junctions
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Invited Speakers
Modeling and Simulation Challenges in Modern Power Discrete Semiconductor Technologies
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Modeling of Low-Frequency Noise and BTI in Electron Devices
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Application of AI and ML in the Compact Modeling Domain
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On-chip ESD protection design optimization using ESD device compact models
Coming soon
Compact Modeling of Ferroelectric Memory Devices and Neuromorphic Computing Applications
Coming soon
Applications of Machine learning techniques in the Compact Modeling Platform
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Compact quantum dot models for hybrid microwave circuits and quantum information processing
Coming soon